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Thin-Film Metrology · MProbe® Systems

Thin-film thickness measurement systems

MProbe® spectroscopic reflectance systems measure film thickness, optical constants (n, k) and surface roughness - trusted by thousands of companies and universities across semiconductor, medical device, solar and optical coating production.

Thickness range
1 nm – 2 mm
thickness range
Precision
< 0.01 nm
measurement precision
Materials library
500+
materials in library
Setup time
< 20 min
unbox to first result
Deployed across
  • Semiconductor
  • Medical Devices
  • Solar & PV
  • Optical Coatings
  • Display & OLED
  • Universities & Research
Product Family

One platform. A system for every line.

Every MProbe shares the same measurement engine and TFCompanion software - choose the configuration that fits your samples, spot size and process, and upgrade as you scale.

MProbe 40 small-spot thin-film measurement system

Small spot · Manual mapping

MProbe 40

Small-spot measurement for patterned samples and fine structures, with camera imaging to pinpoint the exact measurement location and display results directly on the sample image.

Explore MProbe 40

Desktop · Single spot

MProbe 20

The benchtop standard, used in thousands of applications worldwide. Thickness and refractive index from 1 nm to 1 mm with a single mouse-click - modular and easy to upgrade.

Explore MProbe 20
MProbe 60 thickness mapping result

Mapping automation

MProbe 60

Turnkey small-spot + mapping system for R&D centers and small manufacturing. 1 nm – 2 mm.

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MProbe UVVis thin-film measurement system

Extended range · UV–Vis

MProbe UVVis

Extended spectral range for very thin films and demanding materials, down to the UV.

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MProbe HC system measuring a curved headlight surface

Curved surfaces

MProbe HC

Coating measurement on curved parts - headlights, lenses and formed optics.

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TFCompanion™ Software

The analysis engine behind every measurement.

Included with every MProbe system and available standalone, TFCompanion turns raw reflectance, transmittance and ellipsometry spectra into physical answers.

  • Analyze - thickness, n&k, roughness and bandgap from reflectance, transmittance or ellipsometry data. No limit on layers.
  • Simulate - model spectra from any filmstack and optimize your measurement recipe before you run it.
  • Integrate - TCP server interface for process control, plus import from all major ellipsometers and reflectometers.
  • 500+ material library - with parameterized models from Cauchy to Tauc-Lorentz and Drude.
TFCompanion software showing a measurement result with camera image of the sample
Diagram of spectral reflectance from a multilayer filmstack
Technology

Spectroscopic reflectance, engineered to the limit.

MProbe analyzes how light reflects from your sample across UV, visible and NIR wavelengths. No moving parts, results in seconds - and because opacity is a matter of wavelength, even films that look opaque to the eye can be measured in the right spectral window.

  • Thickness, n&k and roughness in a single non-destructive measurement.
  • Multilayer filmstacks - up to 5 independent layers, hundreds with linked-layer analysis.
  • UV to NIR spectral coverage - solar absorbers, rough surfaces and thick films stay measurable.
Why Semiconsoft

You talk to the engineers who built it.

No call centers, no sales scripts. The people who answer your questions are the same engineers who have designed MProbe systems and TFCompanion software for decades.

Application support before you buy

Send us your samples and requirements - we'll verify the measurement and recommend the right configuration.

Global local support

A worldwide network of representatives, plus direct remote online access to your system when you need help fast.

Customization welcome

Special requirements, process integration, custom software or hardware - we love the challenge.

One-year warranty & updates

Every system ships with a test report, step-by-step setup instructions, technical support and software updates.

“Everybody is a thin-film measurement expert with MProbe.”
The philosophy we've built every system around - precise metrology that doesn't require a metrologist.

Have a question? We love talking about all things thin films.

Tell us about your film, substrate and process - a measurement engineer will recommend a configuration, or verify feasibility with a sample measurement.