Where it started
Semiconsoft, Inc. was founded in 2001 with a single mission: make the data analysis of thin-film thickness and n, k measurement easy and transparent for the people doing the work. TFCompanion™ software let engineers import reflectance, transmittance, ellipsometry and imaging-ellipsometry data and analyze it quickly - and it was the only software that supported data import from a wide range of thin-film measurement systems. Consistent analysis across instruments helped qualify systems and identify which configuration worked best for a given application. TFCompanion became the de-facto standard for thin-film measurement software.
From software to system
In 2008 we introduced the MProbe® system, integrating TFCompanion with a newly designed spectroscopic reflectometer. The result was an affordable thin-film thickness measurement system with remarkable accuracy and precision, wrapped in powerful, user-friendly software. An MProbe measurement takes less than a second, performed by operators who can be trained in minutes - so everybody becomes a thin-film measurement expert.
Always improving
MProbe systems and software are continuously updated with new features and capabilities based on customer feedback - we've never stopped developing and innovating. MProbe is used for thousands of thin-film applications, and we keep learning about new ones. Beyond our standard configurations, we develop custom systems for OEM and production applications.
Built in the USA
All of our systems are designed and manufactured in the USA. They're built from scratch to the highest standards, and we take pride in their performance.