Semiconsoft, Inc was founded in 2001 with the mission to make data analysis of thin film thickness measurement and n&k easy and transparent to users. TFCompanion software enabled engineers to import ellipsometry, reflectance, transmittance and imaging ellipsometry data and quickly analyze it. TFCompanion was the only software that supported import of measurement data from a wide range of thin film measurement  systems. Consistent analysis of the data helped in qualification of the systems.   It also helped to determine which system configuration works best for specific application. TFCompanion became a de-facto standard for thin film measurement software. 

    In 2008, MProbe system was introduced –  TFCompanion software was integrated  with the newly designed  spectroscopic reflectometer hardware. The result was an affordable thin film thickness measurement system with remarkable accuracy, precision and powerful user -friendly software interface.  MProbe measurement takes less than a second by operators that can be trained in minutes.  Everybody is a thin film measurement expert with MProbe system.

        MProbe thin film measurement systems and software are being continuosly updated  to include new features and capabilities based on customers feedback. We never stopped development and innovation. MProbe is used for thousands of thin film application  and we are constantly learning about new uses. In addition to standard system configurations, we offer custom system development for OEM and production applications.

All our  systems are designed and manufractured in USA. They are build from the scratch to the highest standards and we take pride in their performance.