SH200A sample stage - reflectance and transmittance, made simple.

Why calibration distance matters

Thin-film thickness measurement relies on measuring absolute reflectance. A reference sample of known reflectivity - typically silicon or quartz - establishes the relationship between measured intensity and absolute reflectivity, a step known as "taking baseline" or calibration. For that calibration to stay valid, the measurement conditions must be unchanged - in particular, the distance from the lens to the sample must match the calibration distance. This is especially important for thicknesses below 50 nm. The SH200A's fine height adjustment lets you reproduce that distance across substrates of different thicknesses.

Why use the SH200A

• Easy, reliable measurement of coatings on samples with different substrate thicknesses
• Flexible configuration for reflectance, transmittance or both
• Long-working-distance focusing lens reduces sensitivity to lens position and makes the measured location easy to see
• Camera option to review and document measurement locations and results
• Optional simultaneous reflectance and transmittance measurement
• Supports small and large samples (up to 200 mm)
• Stable solid-aluminum construction with a rack-and-pinion height adjustment

Options

• -TO (Transmittance option) - two quartz collimators, transmittance accessory, fiber-optic cable and a set of four stainless legs. Manual reconfiguration is required to switch between reflectance and transmittance.
• -TR option - fiber-optic cable, four stainless legs and an integrating sphere. Reflectance or transmittance can be measured without manually reconfiguring the stage, and simultaneous reflectance/transmittance is supported.
• -CAM (Camera option) - a 2 MP camera with imaging lens and holding fixture. Because the light spot is not easily visible on many samples, an electronic reticle in TFCompanion™ pinpoints the measurement location and displays results directly on the image. Independent imaging software is also included.