Every MProbe® system shares the same spectroscopic reflectance engine and TFCompanion™ software. Choose the configuration that fits your samples, spot size and process - then measure thickness, optical constants (n, k) and surface roughness of practically any translucent film.
MProbe systems analyze how light reflects and transmits across UV, visible and NIR wavelengths. Practically any translucent coating or free-standing film can be measured, on substrates from silicon wafers to glass, metal and polymer. Because opacity is a matter of wavelength, even films that appear opaque to the eye - solar absorbers, for example - can be measured in the right spectral window.
Small spot · Manual mapping
A microspectrophotometer (MSP) that combines an inspection microscope with the MProbe measurement unit. Small-spot measurement for patterned wafers, MEMS, curved parts and fine structures - with camera imaging to pinpoint the exact location and display results directly on the sample image.
Explore MProbe 40Desktop · Single spot
The benchtop standard, used in thousands of applications worldwide. Thickness and refractive index from 1 nm to 1 mm with a single mouse-click - modular, and easy to upgrade as your requirements grow.
Explore MProbe 20
Mapping automation
Turnkey small-spot and mapping system for R&D centers and small manufacturing. 1 nm – 2 mm.
Explore
Economical · Visible
Compact, versatile Visible-range desktop system. 10 nm – 150 µm, with a rugged VisX variant for 24/7 lines.
Explore
Extended range · UV–Vis
200–1000 nm range for very thin films and UV-absorbing materials such as TiO₂ and ZnO. Includes the gated UVVisF variant.
Explore
Curved surfaces
Coating measurement on curved and large parts - headlights, lenses and formed optics - using a flexible manual probe.
Explore
In-situ · Deposition
Real-time thickness and optical-constant monitoring inside deposition chambers. Gated acquisition supports measurement in high ambient light.
Explore MProbe 50
Inline · Production lines
Continuous film and coating thickness measurement on production lines, including roll-to-roll webs. Available in multipoint and scanner configurations.
Explore MProbe 70Every line shares the same measurement engine, TFCompanion software and 500+ material library. They differ by form factor, spot size and how they integrate with your process. Within each line, spectrometer wavelength range and resolution are matched to your application.
| Model | Configuration | Typical use | |
|---|---|---|---|
| MProbe 20 | Desktop, single spot (< 1 mm) | Benchtop R&D and QC - the standard configuration | View |
| MProbe 40 (MSP) | Small spot, integrated microscope | Patterned wafers, wires, stents, curved & rough parts | View |
| MProbe 50 | In-situ, gated acquisition | Real-time monitoring inside deposition chambers | View |
| MProbe 60 | Small spot + XY mapping automation | R&D centers and small manufacturing, thickness maps | View |
| MProbe 70 | Inline - multipoint or scanner | Continuous measurement on 24/7 production lines | View |
| MProbe HC | Manual probe on Vis platform | Coatings on curved and large parts | View |
| MProbe Vis / VisX | Visible 400–1000 nm desktop | Economical general-purpose measurement, 10 nm–150 µm | View |
| MProbe UVVis / UVVisF | Extended 200–1000 nm desktop | Very thin films, UV-absorbing materials, gated variant for high ambient light | View |
Tell us about your film, substrate and process - a measurement engineer will recommend a configuration or verify feasibility with a sample measurement.