MProbe 20 - benchtop thin-film measurement
A desktop measurement system used in thousands of applications worldwide. Measure thin-film thickness and refractive index from 1 nm to 1 mm - including multilayer filmstacks - with a single mouse-click.
Overview
MProbe® 20 is the single-spot desktop system at the heart of the MProbe family. Its measurement is based on spectroscopic reflectance - fast, reliable and non-destructive, with no moving parts. Thicknesses from 1 nm to 1 mm, including multilayer filmstacks, are measured quickly and repeatably.
Different MProbe 20 models are distinguished primarily by the wavelength range and resolution of their spectrometers, which in turn set the thickness range and the materials that can be measured. Whatever the configuration, the workflow is the same: focus, click, read the result.
Why MProbe 20
- Flexible & modular - select the best configuration for your application and upgrade when your requirements grow.
- Precision - < 0.01 nm or 0.01%.
- 500+ material library - with dozens of parameterized dispersion models.
- Powerful software - TFCompanion™ handles the most complex applications: no limit on the number of layers, plus backside-reflectance, surface-roughness and dullness corrections.
- Easy integration - TCP server interface for process control.
- Affordable - an unmatched price-to-performance ratio.
Configurations & thickness ranges
MProbe 20 is available across a range of spectrometer configurations. Each pairs an F3 or F4 spectrometer with a matched light source and detector to cover a specific wavelength and thickness range.
| Model | Wavelength range | Thickness range | Spectrometer / source |
|---|---|---|---|
| Vis | 400–1000 nm | 10 nm–150 µm | F3 Ariel, 2048 px CMOS, 5 W TH lamp |
| UVVis | 200–1100 nm | 1 nm–75 µm | F3 Ariel, 20 W TH + 30 W Deuterium lamp |
| Vis-HR | 700–1100 nm | 1–400 µm | F4, 2048 px backthinned, 5 W TH lamp |
| NIR | 900–1700 nm | 50 nm–150 µm | F3 NIR, 512 px InGaAs, 5 W TH lamp |
| VisNIR | 380–1700 nm | 50 nm–250 µm | F3 Vis CMOS + F3 InGaAs, 5 W TH lamp |
| UVVisF | 200–1000 nm | 1 nm–20 µm | F4, 2048 px CCD, 20 W Xe flash lamp |
| UVVisNIR | 200–1700 nm | 1 nm–75 µm | F4 backthinned + F4 InGaAs, TH & Deuterium lamps |
| NIR-HR | 1500–1550 nm | 10–1800 µm (glass), 4–400 µm (Si) | F4, 512 px InGaAs, 5 W TH lamp or SLD |
What's in the box
- Main unit - spectrometer, light source and light-controller microprocessor
- SH200A sample stage with focusing lens and fine adjustment
- Fiber-optic reflectance probe
- TFCompanion-RA software, USB license dongle, distribution media and User Guide
- Calibration set (bare Si wafer and/or quartz plate and/or Al mirror) plus black absorber
- Test sample - 200 nm Si oxide or PET film, depending on model
- USB or LAN cable and 24 V DC power adapter (110/220 V)
Ready to measure your films?
Send us your film, substrate and thickness range - we'll confirm the right MProbe 20 configuration for the job.
Related measurement applications
Brochures and technical documents
- MProbe 20 brochure (2018 edition) (PDF)
- MProbe thickness measurement ranges (PDF)
- MProbe Vis brochure (2023 edition) (PDF)
- MProbe UVVis brochure (2016 edition) (PDF)
- MProbe VisHR brochure (2016 edition) (PDF)
- MProbe NIR brochure (2018 edition) (PDF)
- MProbe VisNIR brochure (2020 edition) (PDF)
- MProbe UVVisF brochure (PDF)
- MProbe UVVisNIR brochure (2017 edition) (PDF)